CBA 3000 - All in One Circuit Breaker Analyzer

Click on Image to Enlarge

The ultimate all-in-one circuit breaker analyzer: safer, faster and more accurate than ever. It allows any timing test, motion and speed analysis, multiple contemporary static and dynamic contact resistance measurements, Both Sides Grounded (BSG) tests, Undervoltage condition test and more. All these functions are integrated in a single lightweight test case without the need of connecting additional external modules

click for enlargement

The all-in-one circuit breaker analyzer and micro-ohmmeter model CBA 3000 is a unique test set. When used as a Circuit Breaker Analyzer, it allows the off-line testing of MV and HV circuit breakers. The test set measures circuit breaker operation times as they are defined in the IEC standard 62271-100.
CBA 3000 is also a three/six /nine breaks micro-ohmmeter, it allows measuring the Static Contact Resistance (SCRM) of the circuit breaker contact and the Dynamic Contact Resistance (DCRM), that is how the breaker contacts resistances change while the breaker is closing or opening. This allows detecting hidden defects, that are otherwise impossible to be diagnosed. 
Faster: one single connection set up to perform automatically all possible 
Circuit Breaker tests
Safer: Both Side Grounded feature without any additional external boxes/
Fully configurable
3/6/9 static and dynamic contact resistance measurements 200A DC 
output each
Three phase first trip measurement
16 or 24 fully user configurable Main/PIR and auxiliary input contacts
2, 4 or 6 Open / Close coil commands
3 analog linear/rotary transducers and 3 digital transducers inputs for travel/ 
speed analysis
8 analog input measurements: battery voltage, motor current, pressure 
transducers and any other measurements
Minimum voltage trip coil test, fully automatic
On-screen control and test results evaluation
TDMS software suitable for test executions, results analysis, archiving and 
test report creation
Library of standard test plans are available with the test set